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This Collection aims to provide a comprehensive overview of the latest research on defect characterization and control in 2D materials and devices.

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Defect Characterization and Control in 2D Materials and Devices

  • 专题合集

  • 发表日期：

    2025年

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摘要

This Collection aims to provide a comprehensive overview of the latest research on defect characterization and control in 2D materials and devices.