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Research on Key Technologies of Intelligent Defect Image Detection for Substation Equipment in Complex Scenes

  • Ning Yang,
  • Lihua Li,
  • Yang Yang,
  • Jiayun Zhu,
  • Wentong Shang

摘要

Image feature matching and image recognition are two important branches of image processing. In recent years, with the rapid development of artificial intelligence, big data and other information technology, as well as the technological breakthrough of computer computing ability, image analysis technology has been widely used in various industries. Daily inspection and defect detection of substation equipment is an important work of equipment operation and maintenance. Relying on image intelligent processing technology, it can greatly improve the efficiency of operation and maintenance, reduce the workload of operation and maintenance personnel, improve the detection probability of equipment defects and abnormalities, and ensure the safe and stable operation of power grid. Aiming at the complex defect scene of substation equipment, it has good research significance and application prospect to carry out the research of intelligent defect image detection technology. This paper described the basic principles and development of image feature matching technology and artificial intelligence image recognition technology, discussed the key problems and technical difficulties in the practical application of image processing technology, introduced the solutions and technical characteristics of key technologies, and put forward the image intelligent detection algorithm and multi-dimensional image comprehensive analysis method suitable for complex scenes. The verification results indicated that the method described in the article can effectively solve the problem of device multi scene defect detection.