Fuzzy Logic Approach for Life Time Estimation of Polyimide (PI) Insulations Used at High-Frequency
摘要
The critical role of insulation system quality in the proper functioning of solid-state transformers (SST) is very important. To ensure that the SST is maintained properly and estimate its lifespan, certain parameters must be measured, reflecting the degradation rate of the transformer dielectric insulation. However, the complexity of the insulation structure and degradation process can make this task difficult. To address this issue, the paper proposes a new approach using fuzzy logic to create a reliable insulation life model that predicts the life of an SST based on experimental tests. The validity of this fuzzy logic model is confirmed by experimental data collected under various parameters, including voltage magnitude, frequency, and temperature. The results show that the proposed model is effective and can assist in making timely decisions to protect equipment.