Fault Localization Method for Ring-Shaped DC Microgrids Based on Line Model and Euclidean Distance

The rapid and precise localization in DC microgrids is a key technology that needs to be addressed urgently due to their characteristics such as fast-rising current and high amplitude during fault conditions. This paper establishes a mathematical model of the ring-shaped DC microgrid circuit and proposes a novel fault localization method by combining Euclidean distance with an optimization algorithm. Firstly, line models for the normal and ground fault states of the ring DC microgrid are established based on electrical quantities of the microgrid. Secondly, the correlation coefficient of the fault current is calculated using the Euclidean distance measure. Finally, a short-circuit fault localization scheme is established by integrating the Euclidean distance measurement with the genetic algorithm. The simulation results demonstrate that this method can accurately detect the fault location and transition resistance, and is applicable for locating low-resistance and high-resistance short-circuits. The method has low communication requirements, certain anti-interference ability, and satisfies the reliability requirements of protection for DC microgrids.