XAFS Characterization of Materials—A Realistic Evaluation

Synchrotron-based XAFS has evolved as unique and versatile tool for local structure and valence state information of materials. This article revisits the concepts of XAFS, mainly with non-XAFS community in mind. Realistic evaluation of XAFS applications is presented through examples, wrt the extent and preciseness of information that can be extracted from diverse systems. This should guide users through defining XAFS problems, sample selection, and analysis.