Recrudesce: IoT-Based Embedded Memories Algorithms and Self-healing Mechanism

As rapid increase in IoT framework in edge computing, the data storage requirement is also increased. This data is stored in RAID 5 (Redundant array of independent drives) disks which require memory testing and a repair algorithm for a reliable design system. MBIST design system depends on the memory testing algorithm. Various fault detection approaches are introduced using March test on SRAM and DRAM. But, still, some focus is required in terms of time penalty and fault coverage. This paper introduces a novel approach for fault detection in memory with less time penalty, better fault coverage, and device utilization performance with the help of the IoT framework in edge computing. An IoT framework system is proposed for proper monitoring of memory under test for fault occurrence and number of fault repair for SRAM. Results show the optimal faults repair and with less time penalty. The simulation is conducted on MATLAB and Xilinx ISE suite. Proposed work can be used in commercial and space application where radiation hardened memories is used.