The electrical contact structure of the contact finger is a crucial component in the high voltage bushing's electric energy transmission system. Its reliability directly impacts the operational stability and safety of the bushing. To investigate the normal contact and friction behaviors of the strap contacts from the atomic level, a molecular dynamics model of the central conductor-strap contacts contact pair was established. The normal contact and horizontal friction behaviors of the contact surface were analyzed from the aspects of normal contact force, friction force, atomic structure evolution and dislocation line evolution. The findings reveal that as the contact deepens, the dominant force shifts from gravity to repulsion during normal contact. Additionally, the total length of dislocation lines increases from 100 Å to 400 Å, and some atoms are transformed from the FCC (face-centered cubic) structure to other structures like BCC (body-centered cubic) and HCP (close-packed hexagonal). During the horizontal friction process, there is a gradual accumulation of atoms in front of the indenter and the friction force stabilizes after an initial sharp increase. The friction force is observed to rise in correlation with the relative motion speed. Specifically, the first friction force peak is approximately 50 nN at a speed of 100 m/s, while it decreases to around 30 nN at speeds of 25 m/s and 10m/s.