Methods for Analysis and Characterization of Nanomaterials

High-resolution scanning electron microscopy (SEM) is excellent for size and shape characterization of nanoparticles due to the relatively quick and simple sample preparation and image acquisition required. Although SEM images are two-dimensional (2D) representations of 3D objects at a certain viewing angle, SEM images contain a certain amount of 3D information, and the shapes of simple structures with subnanometer precision can be reconstructed by model-based measurements.