Chromatic Confocal Diffractive Image Profilometry (CC-DIP)
摘要
This chapter introduces the core principles of a chromatic confocal diffractive image profilometry (CC-DIP) system, which can be regarded as a variant of DIP presented in previous chapters. CC-DIP aims to enhance the lateral and axial resolution of conventional point scanning chromatic confocal microscopy (PSCCM) with a deep learning-assisted deconvolution algorithm and a scalar diffraction-based parametric model.