错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

Applications of Diffractive Image Profilometry (DIP)

  • Liang-Chia Chen,
  • Guo-Wei Wu,
  • Sanjeev Kumar Singh,
  • Wei-Hsin Chein

摘要

This chapter starts with the basic properties of the actual setup system, progressing from DIs without aberration film to DIs with aberration film. Subsequently, it delves into the testing of system stability. Following this, flat roughness samples are tested to provide a suggested limitation about applicable roughness.