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State-of-the-Art Optical Profilometry Techniques

  • Liang-Chia Chen,
  • Guo-Wei Wu,
  • Sanjeev Kumar Singh,
  • Wei-Hsin Chein

摘要

This chapter reviews state-of-the-art optical profilometry techniques and discusses surface-dependent errors that arise during profile measurements. Potential methods developed for minimizing these errors are examined to highlight the scientific problem to be solved by diffractive image microscopy.