EUV Spectroscopy of Highly Charged Ions with an Electron Beam Ion Trap
摘要
An electron beam ion trap (EBIT) is a powerful device for studying spectra of highly charged ions systematically. Originally, it was developed mainly for spectroscopic studies of few-electron heavy ions in the high-energy X-ray region. However, studies in the extreme ultraviolet (EUV) range have also been widely performed subsequently as EUV spectra of highly charged ions are recognized to be important for industrial applications as well as diagnostics of high-temperature astrophysical and fusion plasmas. This chapter briefly surveys spectroscopic studies of highly charged ions in the EUV region with an EBIT.