Measurement Uncertainties
摘要
The measurement uncertainties in metrology are generally combining statistical characteristics of experimental results variability and mainly subjective not measurable sources of variability. The simplification of the metrological (ISO) approach and possible sources of inaccuracies due to the limiting validity of some a priori assumptions about the behavior of the data are discussed. The deep comparison of the relationships between the measurement uncertainties calculated in accordance with ISO standard and the uncertainties based on statistical data analysis are presented. A simulation-based method for calculation of uncertainties of indirect measurements is shown.