A Novel Sizing Approach for Robust and Efficient Near-Threshold Standard Cells Using Statistical Models

The robustness and functional stability of standard cells provided by Foundries cannot be guaranteed at near-threshold voltage (NTV). The heightened sensitivity to process variation and imbalance between pull-up and pull-down networks pose challenges in the design of near-threshold standard cells. In this paper, we derive accurate statistical current models to obtain an initial sizing solution set based on the proposed balance criterion and the width-proportional segment method, taking into account variations. Subsequently, the optimal and efficient sizing solution is determined through the derived objective function. Experimental results demonstrate that a robust and efficient standard cell operating at NTV can be accurately and easily designed using the proposed sizing method, which holds applicability across various process nodes.