SEM
摘要
Scanning Electron Microscopy (SEM) is a powerful analytical technique used to obtain high-resolution images of the surface and composition of materials at the microscale. In the context of cement and concrete, SEM is utilized to analyze the microstructural properties of these materials, including the hydration products, pore structure, and interfaces between cement paste and aggregates. This technique involves bombarding the concrete sample with a focused beam of electrons, which interact with the atoms of the sample, producing various signals that can be used to generate images and gather compositional data.