Scanning Electron Microscope (SEM)
摘要
Scanning Electron Microscopy (SEM) is a pivotal analytical technique in the study of construction materials, particularly cement and concrete. SEM operates by scanning a focused beam of electrons over a sample to produce high-resolution images of the sample’s surface topography and composition. This method is crucial for analyzing the microstructural changes in cement and concrete when exposed to severe environmental conditions, such as extreme temperatures, high humidity, or corrosive environments. SEM’s ability to provide detailed images at the microscale allows researchers and engineers to observe the morphology of cement hydrates, the formation of microcracks, and the distribution of chemical elements within the concrete matrix (Scrivener and Snellings 2016).