CMOS Linear Image Sensor Based Data Acquisition System for Surface Plasmon Resonance Measurement

This paper presents the working of a complementary metal oxide semiconductor (CMOS) linear image sensor based data acquisition (DAQ) system for monitoring of surface plasmon resonance (SPR). The working of the image sensor is governed by a driver circuit designed using Proteus 8 Professional and LTspice software respectively. The DAQ system is integrated to a custom made SPR measurement system for continuously monitoring the intensity of the reflected light from a prism in total internal reflection (TIR) condition. The clock and timing signals to the image sensor were provided using a microcontroller which receives the signal voltages from the sensor and performs analog-to-digital conversion for serial transmission to a computer.