Research and Application of Infrared Radiation Measurement for Asymmetric Translucent Material Based on Three Different Substrate
摘要
The temperature level of the asymmetric translucent primary mirror in a diffraction imaging system is highly sensitive to the radiation environment of its surroundings. In order to ensure the temperature level of the primary mirror on-orbit, it is necessary to obtain its accurate infrared radiation parameters. Based on analysis of the radiometer measurement system, a mathematical model for infrared radiation parameters of asymmetric translucent materials is established in this paper. A new method for measuring infrared radiation parameters is proposed, which three different emissivity materials are used as substrate, and infrared radiation parameters of the translucent primary mirror are obtain by solving the mathematical model with the measuring results.