Research on the Experimental System and Method for Radiation Effects of Nanoscale Electronics in Orbit Space

With the establishment of China's space station, real experimental verification conditions have been provided for conducting research on space radiation effects of nanoscale electronic components in orbit. Considering the urgent needs of spacecraft for in orbit maintenance, hardware replacement, functional upgrades, and other in orbit services, this paper designs a testing platform that can simultaneously support dozens of nanoscale electronics for space radiation effects in orbit, solving the current dilemma of single types of in orbit verification tests for electronic components, inability to generate economies of scale, and inability to systematically conduct scientific experimental research. The testing platform adopts standard mechanical, electrical, and thermal interfaces, adopts a modular replaceable architecture, supported in orbit software upgrades, reconfigurable system design, and supported astronauts to regularly replace test modules in orbit. We can continuously complete in orbit radiation resistance performance testing research for new materials and new process nanoscale electronics, and achieve in orbit upgrade of nano level electronics verification tasks. In this paper, the test data of space radiation effect of 16 nm FinFET process FPGA in orbit are given, and the real Single-event upset rate caused by space radiation effect in Low Earth orbit (orbit height is 400–450 km) and the countermeasures are analyzed, providing strong support for the aerospace applicability research of domestic nanoscale electronics.