Impact of Various Device Parameters on the Series Resistance of Perovskite Solar Cell

Perovskite solar cells have shown immense potential in field of photovoltaic with a rapid surge in their efficiency in less than 10 years of research and owing to the ongoing work by researchers to improve their stability, they are projected to be commercialized in the near future. The diode parameters of a solar cell is regarded as an important aspect for a device development engineer. In this report we have presented a comprehensive numerical analysis to show the effect of various material parameters such as active layer thickness, active layer defect density and work function of top contact electrode on the internal series resistance (Rs) of a mixed-cation Perovskite (FA0.8MA0.2Sn0.5Pb0.5I3) in relation to the device performance. We observed a non-uniform relation of thickness with the Rs, Furthermore, as the defect density rises, the Rs rises, resulting in a drop in device efficiency. Finally a low Rs was found for the ohmic contact between top contact/transport layer junctions.