Optimization of Non-Destructive Testing of Power Equipment Based on X-ray Backscattered Imaging

Unlike conventional X-ray transmission imaging, X-ray backscattered imaging, which is based on the Compton effect, offers the advantage of imaging on the same side as the source-detector setups. This characteristic proves to be highly advantageous in specific applications, such as handheld security inspection. Which usually fixes a universal energy and flying-spot scanning method. To extend its innovative application to other fields, such as portable non-destructive testing of power equipment, we have utilized Monte Carlo simulation to establish a fundamental parameter model for X-ray backscattered imaging of defects. This model has enabled us to systematically investigate the impact of X-ray energy on backscattered resolution and imaging quality. Experimental tests were also implemented to verify the feasibility of same-side imaging for power equipment and confirm the optimal energy selection.