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Development of Contact Resistance Measurement Device for GIS Main Circuit Contacts

  • Shuai Sun,
  • Xingwang Li,
  • Congwei Yao,
  • Bin Tai,
  • Linglong Cai,
  • Jianjun Li,
  • Xiaofeng Pang

摘要

The contact resistance of GIS contacts is related to the stable operation of the power system. In this paper, a GIS contact resistance measurement device based on the pulse current method is developed on the FPGA platform, which accurately measures the time-domain curve of contact resistance by compensating for the influence of inductance, which is of positive significance for further evaluating the contact contact state.