Guidelines for Better Microstructure Characterization of Cement-Based Materials by XCT
摘要
In situ and nondestructively assessing the 3D microstructure of materials and its evolutions by X-ray computed tomography (XCT) is now a very hot topics in all fields of science. Here presented the basic principles, testing procedures, and the typical applications of XCT in the characterization of cement-based material’s (CBM) microstructure. The initial portion of this chapter introduced the fundamental knowledge about XCT technology, covering the discovery of X-rays, its interactions with matters and the attenuation laws, the components of a XCT, and the basic procedures to conducts a test, the artifacts patterns that may affect the final analysis, etc., which ensures the readers with a deep understanding of this methodology, knowing the proper way to prepare specimen. The latter half briefly presents some typical applications of using XCT studying the inner multi-scale structures of CBMs, including the pores and micro-cracks, fibers, durability, and in situ testing. This chapter is specifically suitable for beginners in this field. By reading this chapter, readers can understand what XCT is, what it can do, how to conduct it, and what information can be derived from an XCT test.