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Microstructure Characterization in Cementitious Materials by Quantitative Analysis of BSE and EDS Images

  • Lihui Li,
  • Wei Xu

摘要

Recent advancements in scanning electron microscopy (SEM) imaging, particularly backscattered electron (BSE) and energy-dispersive X-ray spectroscopy (EDS) techniques, have revolutionized microstructural characterization of cementitious materials. The integration of BSE imaging with qualitative and quantified EDS mapping enables phase identification and microstructure quantitative analysis. Artificial intelligence (AI), through machine learning and deep learning algorithms, has further enhanced image processing capabilities. These AI-driven methods have achieved notable progress in phase quantification, reaction monitoring, and micro-property prediction, providing deeper insights into reaction mechanisms. This chapter provides a systematic overview of microstructural characterization in cementitious materials through the quantitative analysis of BSE imaging and EDS mapping. It begins with a brief review of SEM fundamentals and quantitative BSE/EDS analysis methodologies. Looking ahead, the integration of diverse SEM data and the increasing reliance on AI are expected to position these technologies as indispensable tools for microstructural characterization in the field of cementitious materials.