Reliability Model of Railroad Traffic Control System Equipped with Peltier Cell
摘要
The chapter presents a mathematical model to assess the reliability of railroad traffic control systems with a Peltier cell installed. The semiconductor element will be used to support electronic components found in trackside equipment. In the prepared model, Markov processes were used to describe the states occurring between the various elements of the TCS system. Simulation tests mainly consisted of determining the average failure time of an element. The presented results were carried out for 1000, 2000 and 3000 rail vehicle passes over railroad tracks equipped with TCS systems. At the end of the chapter, conclusions resulting from the computer simulations are presented.