X-rays are essential in forensic science, providing valuable insights into a wide range of evidence crucial for criminal investigations and legal proceedings. They are used to examine art and historical artefacts, uncovering underdrawings and repairs. X-rays also help detect hidden/concealed objects, analyse gunshot residues, and inspect oversized items or structures. In post-mortem imaging, they offer detailed insights into internal injuries and foreign bodies. Various specialized X-ray techniques, such as X-ray diffraction (XRD), X-ray fluorescence (XRF), and particle-induced X-ray emission (PIXE), have been developed for forensic analysis. These techniques allow for detailed material analysis at the elemental and structural levels. XRD is used to identify crystalline substances, making it valuable for analysing drug samples, explosives, and fibres. XRF and its variants (WDXRF, EDXRF, TXRF) are powerful for non-destructive elemental analysis and are helpful in examining paint, glass, metals, and soil samples. PIXE provides sensitive elemental analysis, particularly for detecting trace elements in forensic samples. This review paper provides a comprehensive overview of the use of X-rays in forensic science.