Metrology in Electronic Devices
摘要
Electronic metrology has undergone a structural transformation following the revision of the International System of Units (SI), whereby electrical units are realized through fixed numerical values of fundamental constants. This chapter provides a comprehensive metrological analysis of electronic measurements, encompassing DC and AC quantities, impedance, electromagnetic fields, and radiofrequency metrology. It examines the principles of metrological traceability in electrical measurements under the revised SI, the role of quantum electrical standards—such as Josephson voltage standards and the quantum Hall effect—in the realization and dissemination of units, and their integration into national and international calibration chains. The chapter further addresses the evolving role of interlaboratory comparisons within the CIPM Mutual Recognition Arrangement (CIPM MRA), highlighting how digital infrastructures are reshaping equivalence assessment, measurement uncertainty evaluation, and confidence in calibration and measurement capabilities. The impact of digital transformation on electronic metrology is then discussed through the adoption of digital calibration certificates, structured metrological metadata, and interoperable digital metrological traceability frameworks. Emerging developments, including artificial intelligence-assisted measurement systems, digital twins for calibration and comparison, and sustainability-driven measurement technologies, are analyzed from a metrological perspective. The chapter concludes by outlining a future-oriented vision in which electronic metrology evolves toward service-oriented and digitally integrated models, supporting reliable, traceable, and internationally recognized measurements across increasingly autonomous and connected systems.