Integrated Data and Fault Ingestion for Sensor Signal Emulation in HiL Frameworks for IoT Applications
摘要
The Internet-of-Things (IoT) ecosystem is expanding quickly, which makes it difficult to ensure reliable system validation in changing circumstances. A thorough event-based Hardware-in-the-Loop (HiL) system is examined in this research in order to handle scalability, fault ingestion, and signal fidelity. The study emphasizes techniques for simulating I2C, SPI, UART, and 1-Wire protocols by fusing simulated environments with actual hardware components such as the Adafruit MCP2221A, NVIDIA Jetson Orin Nano, and Raspberry Pi. The framework’s capacity to reproduce sensor behaviors, present problem situations, and verify system performance under increasing sensor loads is illustrated by thorough experimental evaluations. A roadmap for developing HiL systems in the context of IoT is presented in this paper.