Coherent X-ray scattering techniques have emerged as a versatile probe to investigate material behavior at nanoscale in both equilibrium and non-equilibrium conditions. Unlike conventional X-ray imaging methods that rely on complex optical components, coherent scattering is fundamentally limited only by the wavelength of the incident X-rays. The advent of new diffraction-limited sources, coupled with fewer optical constraints, establishes coherent X-ray scattering as a versatile and powerful tool for probing nanoscale dynamical processes. In this chapter, we explore predominant coherent X-ray scattering techniques with a particular focus on X-ray photon correlation spectroscopy (XPCS). XPCS utilizes coherent diffraction patterns, known as ‘speckle patterns’ collected as a function of time, to analyze material fluctuations and dynamics. These speckle patterns serve as unique fingerprints of the sample in reciprocal space, providing critical insight into nanoscale processes. We begin by discussing fundamentals of coherence and requirements for coherent X-ray scattering experiments including XPCS, Coherent Diffraction Imaging (CDI) and Ptychography. We then outline the key experimental considerations for XPCS including optics, sample requirements, detection scheme and other practical aspects of conducting an XPCS experiment. We also describe approaches for data analysis and interpretation for XPCS datasets. We discuss both one-time and two-time correlation functions, factors influencing correlation functions, fitting techniques and relationship between correlation functions and the dynamic structure factor. Finally, we examine the application of XPCS in probing fluctuations in two distinct complex oxides: charge and orbital ordering fluctuations in magnetite near the metal-insulator (Verwey) transition and ferroelectric domain fluctuations in low-strain Barium Titanate thin films. These studies highlight the wealth of information that XPCS and coherent scattering techniques can provide, underscoring their potential to significantly advance the dynamical pathways in correlated oxides.

错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

Coherence X-Ray Techniques for Nanoscale Characterization of Complex Oxides

  • Roopali Kukreja

摘要

Coherent X-ray scattering techniques have emerged as a versatile probe to investigate material behavior at nanoscale in both equilibrium and non-equilibrium conditions. Unlike conventional X-ray imaging methods that rely on complex optical components, coherent scattering is fundamentally limited only by the wavelength of the incident X-rays. The advent of new diffraction-limited sources, coupled with fewer optical constraints, establishes coherent X-ray scattering as a versatile and powerful tool for probing nanoscale dynamical processes. In this chapter, we explore predominant coherent X-ray scattering techniques with a particular focus on X-ray photon correlation spectroscopy (XPCS). XPCS utilizes coherent diffraction patterns, known as ‘speckle patterns’ collected as a function of time, to analyze material fluctuations and dynamics. These speckle patterns serve as unique fingerprints of the sample in reciprocal space, providing critical insight into nanoscale processes. We begin by discussing fundamentals of coherence and requirements for coherent X-ray scattering experiments including XPCS, Coherent Diffraction Imaging (CDI) and Ptychography. We then outline the key experimental considerations for XPCS including optics, sample requirements, detection scheme and other practical aspects of conducting an XPCS experiment. We also describe approaches for data analysis and interpretation for XPCS datasets. We discuss both one-time and two-time correlation functions, factors influencing correlation functions, fitting techniques and relationship between correlation functions and the dynamic structure factor. Finally, we examine the application of XPCS in probing fluctuations in two distinct complex oxides: charge and orbital ordering fluctuations in magnetite near the metal-insulator (Verwey) transition and ferroelectric domain fluctuations in low-strain Barium Titanate thin films. These studies highlight the wealth of information that XPCS and coherent scattering techniques can provide, underscoring their potential to significantly advance the dynamical pathways in correlated oxides.