Automated Reconstruction of Parent Phase Microtexture in a Displacive Phase Transformation
摘要
The room temperature microtexture data can be exploited to reconstruct the parent phase after a displacive phase transformation. This is emerging as an important area for EBSD (electron backscattered diffraction) measurements plus analysis. In this chapter, we have summarized the algorithms behind such reconstruction, and potential challenges plus resources. The objective is to provide an overview to an ‘uninitiated’ to an important, albeit emerging, aspect of materials science and engineering.