Structural, Morphology, and Chemical Species Properties of Reduced Graphene Oxide
摘要
This chapter carried out a detailed analysis of the physical properties of redox oxide (rGO) films by using X-ray lines (XRD), scanning electron microscopy (SEM), and Raman spectroscopy. The research results show that the rGO thin film in the reduction process increases the size of the particles, decreases the distance between the particles, and shows good crystal structure and electrical conductivity. The SEM image shows the layered structure and surface shape of the rGO film, while the spectral analysis reveals the changes in the chemical composition of the rGO film, especially the changes in the defect density and the degree of oxidation. Through detailed comprehensive analysis, rGO provides theoretical support and practical guidance for applications in energy storage, sensors, and flexible electronic equipment.