In the proposed paper, a comparison of BIST with different Pseudo-Random Pattern Generators (PRPGs) is implemented. This architecture contains a PRPG, arithmetic logic unit (ALU), read-only memory (ROM), and a comparator. Some PRPGs are examined, including Linear Feedback Shift Registers (LFSRs), Complete Feedback Shift Registers (CFSRs), Bit Swapped-LFSR (BS-LFSR), and Bit Swapped-CFSR (BS-CFSR). These BIST implementations are evaluated in detail concerning power, area, gate count, and timing analyses. In this paper, the effectiveness of methods to reduce transitions, reduce power, and improve fault coverage is demonstrated. The extensive simulations and comparison schematics for an 8-bit variant designed across a 90 nm technology node are performed. The findings emphasize the benefits of advanced LFSR and CFSR architectures and demonstrate how they may provide more affordable, efficient, and dependable testing solutions for contemporary integrated circuits.