A Deep Mutual Information Adaptive Integrated Neural Network-Based Method for Detecting Defects on Metal Surfaces
摘要
With the comprehensive development of intelligent manufacturing, the requirements for quality inspection of industrial products are becoming increasingly stringent. Defect detection on the surface of product images is a key technology in industrial product quality inspection, and its accuracy directly determines the qualification of product quality. When dealing with low-quality or complex images, defect detection accuracy is often poor. To solve this problem, a metal surface defect detection method based on a Mutual Information Adaptive Integrated Neural Network (MI-AINN) is proposed for defect detection. MI-AINN focuses on analyzing and leveraging the features and their spatial distribution across different image channels through a mutual information mechanism. It continuously optimizes the network model through an adaptive sample weight adjustment mechanism, then integrates the sub-models obtained during the optimization process. This approach helps the network to extract deeply complex features, improving detection accuracy. Experimental results show that compared to individual sub-models, MI-AINN achieves the highest F1-score while maintaining both high recall and low false positive rates.