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Testing and failure analysis are crucial methods for detecting, verifying, and analyzing SiC devices during their development, production, and application processes. Based on test data and detection results, engineers can optimize devices and troubleshoot issues.

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SiC Device Testing and Failure Analysis Techniques

  • 章节

  • 发表日期：

    2025年

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  • Yuan Gao,
  • Yan Zhang

摘要

Testing and failure analysis are crucial methods for detecting, verifying, and analyzing SiC devices during their development, production, and application processes. Based on test data and detection results, engineers can optimize devices and troubleshoot issues.