Scholarlink

In structured illumination microscopy (SIM), the patterns used for structured illumination typically refer to sinusoidal fringes. In the Fourier frequency domain, sinusoidal functions exhibit frequency-shifting properties on the target, thereby containing high-frequency information beyond the cutoff frequency. Super-resolution imaging can be achieved by decoupling and reconstructing the aliased frequency spectrum. This chapter first discusses the origin and basic principles of SIM, followed by an explanation of the extension from 2D-SIM to 3D-SIM, the enhancement of imaging speed through hardware and algorithm improvements, non-typical SIM techniques, SIM in coherent systems, and nonlinear SIM.

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Structured Illumination Imaging

  • 章节

  • 发表日期：

    2025年

查看全文
  • Yiran Wang,
  • Ziyang Li,
  • Shutian Liu,
  • Zhengjun Liu

摘要

In structured illumination microscopy (SIM), the patterns used for structured illumination typically refer to sinusoidal fringes. In the Fourier frequency domain, sinusoidal functions exhibit frequency-shifting properties on the target, thereby containing high-frequency information beyond the cutoff frequency. Super-resolution imaging can be achieved by decoupling and reconstructing the aliased frequency spectrum. This chapter first discusses the origin and basic principles of SIM, followed by an explanation of the extension from 2D-SIM to 3D-SIM, the enhancement of imaging speed through hardware and algorithm improvements, non-typical SIM techniques, SIM in coherent systems, and nonlinear SIM.