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As a core component of modern power electronic equipment, the remaining life of IGBT is crucial to the safe operation and maintenance of power electronic equipment. In this paper, we propose a remaining useful life prediction method for IGBT based on an exponential degradation model. Firstly, the turn-on voltage of IGBT is selected as the degradation state parameter, and an exponential degradation model is established to describe the degradation process of IGBT. Then, the model parameters are updated in real time based on Bayesian theory and Maximum Likelihood Estimation to predict the remaining useful life of IGBT. Finally, the validity of the model is verified by utilizing the power cycling experimental data.

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Research on the Remaining Useful Life Prediction Method of IGBT Based on an Exponential Degradation Model

  • 会议论文

  • 发表日期：

    2025年

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  • Yufeng Wei,
  • Ran Yao,
  • Hui Li,
  • Wei Lai,
  • Siyu Chen,
  • Yirun Ji,
  • Wenqian Yuan,
  • Qing Huai

摘要

As a core component of modern power electronic equipment, the remaining life of IGBT is crucial to the safe operation and maintenance of power electronic equipment. In this paper, we propose a remaining useful life prediction method for IGBT based on an exponential degradation model. Firstly, the turn-on voltage of IGBT is selected as the degradation state parameter, and an exponential degradation model is established to describe the degradation process of IGBT. Then, the model parameters are updated in real time based on Bayesian theory and Maximum Likelihood Estimation to predict the remaining useful life of IGBT. Finally, the validity of the model is verified by utilizing the power cycling experimental data.