Minimum Operating Voltage Prediction by Machine-Learning Algorithms in Microprocessor
摘要
This research aims to address the existing knowledge gap in predicting minimum operating voltage (Vmin) in microprocessor design through various machine-learning methods. As the demand for energy-efficient and high-performance microprocessors grow, accurate Vmin prediction becomes crucial. With a focus on Vmin search procedure and machine-learning integration, the research streamlines testing, cuts costs, prevents degradation of unit, and enhances the product lifespan in semiconductor manufacturing. This paper thoroughly examines the relationship between Intra-Die Variation (IDV), Leakage Current, and Vmin. This study introduces a predictive model for microprocessor design, emphasizing Machine Learning Algorithms-Linear Regression, Random Forest, and Gradient Boosting. Notably, Linear Regression emerges as the most effective, predicting a mere 2.681% voltage variation for high frequency. The proposed model, leveraging Linear Regression, proves resilient, reducing excess voltage and optimizing production processes.