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High-Speed Full Polarization Measurement Technology Based on Photoelastic Modulation

  • Qin Bai,
  • Quanlong Yang,
  • Rui Zhang,
  • Peng Xue,
  • Zhixu Wu

摘要

Polarization measurement technology based on photoelastic modulators has shown significant potential in fields such as advanced material characterization and biomedical detection, characterized by high stability and high-speed modulation capabilities. However, compared to existing photoelastic modulator-based polarization measurement systems, challenges remain in achieving high-speed and high-precision measurements of all Stokes parameters. This paper presents a high-speed full-polarization measurement system that employs a kilohertz-frequency dual-frequency photoelastic modulators to perform high-speed orthogonal coding on incident light. Bessel functions are utilized to analyze the frequency signal and determine the polarization state. With measurement precision on the order of 0.0001–0.001 and overall error across measurement groups <1%, the results demonstrate that the system can conduct full-polarization state measurement and direction discrimination in a single shot. Building on this, a Mueller-matrix error compensation model is established to overcome existing limitations. The measurement precision is further enhanced to the order of 0.00001–0.0001 after error compensation. Polarization measurement advances toward improved accuracy, increased environmental adaptability, and a wider range of applications by achieving sub-percent-level precision and consistent reproducibility across domains.