The increasing role of low-dimensional materials in nanoscale devices makes it essential to understand their thermal conduction properties. However, their atomic-scale thickness and high interfacial thermal resistance pose significant challenges for conventional characterization. This chapter focuses on Raman-based steady-state methods for probing the thermal transport behavior of such materials. Section 3.1 outlines the major challenges in low-dimensional characterization. Section 3.2 introduces the steady-state electro-Raman thermal technique, which combines electrical heating and Raman thermometry to evaluate the thermal conductivity and interfacial resistance of nanoscale systems. Section 3.3 presents the steady-state laser heating Raman characterization approach, employing localized optical excitation to induce controlled temperature rises for non-contact thermal measurements.