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Transmission electron microscopy (TEM) provides a versatile platform for probing real-space structural information across a wide range of length scales, from mesoscopic organization to atomic-scale. This chapter introduces a range of TEM-based imaging techniques, with particular emphasis on scanning transmission electron microscopy (STEM), and illustrates how these techniques can be employed to visualize and quantify lattice order parameters. Through representative examples drawn from diverse material systems, we demonstrate how symmetry, lattice distortions, and local structural variations can be resolved with high spatial precision, enabling direct correlation between structural motifs and functionalities.

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Lattice Order Parameter

  • 章节

  • 发表日期：

    2026年

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  • Hengqiang Ye,
  • Yang Zhang,
  • Lin Xie,
  • Zhenyu Liao,
  • Hui Wang,
  • Wenlong Si,
  • Zhen Chen,
  • Huijuan Zhao,
  • Shiqing Deng,
  • Shaobo Cheng,
  • Zhiying Cheng,
  • Gen Li,
  • Hai Liu,
  • Jing Zhu

摘要

Transmission electron microscopy (TEM) provides a versatile platform for probing real-space structural information across a wide range of length scales, from mesoscopic organization to atomic-scale. This chapter introduces a range of TEM-based imaging techniques, with particular emphasis on scanning transmission electron microscopy (STEM), and illustrates how these techniques can be employed to visualize and quantify lattice order parameters. Through representative examples drawn from diverse material systems, we demonstrate how symmetry, lattice distortions, and local structural variations can be resolved with high spatial precision, enabling direct correlation between structural motifs and functionalities.