The XRD profile analysis is one of the most commonly used methods for crystallite size calculation. In this work, we proposed a simpler and effective approach based on XRD profile analysis, offering insight into the structural properties of crystalline materials and the integration of Savitzky–Golay filter for XRD profile analysis has been discussed in a practical way. This study demonstrates the XRD data processing including denoising, peak detection, and crystallite size estimation in a simplified manner. The variance and standard deviation were also calculated for the manually calculated crystallite size and the algorithm generated crystallite size to show minimal deviation. This makes data analysis cost-effective, reproducible, accurate, efficient, and necessitates minimal manual intervention enabling rapid processing of extensive datasets. Additionally, future advancements in AI integration could further make this an invaluable tool in materials research including novel material, nanoscale property analysis, and thin-film applications.