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The stability of a single mask (SM) triple Gas Electron Multiplier (GEM) detector under prolonged irradiation is studied by monitoring the variations in gain, energy resolution and divider current over time considering the effects of ambient parameters. The dependence of gain and energy resolution on the ratio of temperature and pressure (T/p) and accumulated charge is analysed. Necessary corrections for bias current variations are applied up to an accumulated charge per unit area of 0.48 mC/mm \(^{2}\) . An update on the results is presented in this article.

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Observation on the Effect of Prolonged Irradiation on GEM Detector

  • 会议论文

  • 发表日期：

    2025年

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  • S. Mandal,
  • S. Gope,
  • S. Das,
  • S. Biswas

摘要

The stability of a single mask (SM) triple Gas Electron Multiplier (GEM) detector under prolonged irradiation is studied by monitoring the variations in gain, energy resolution and divider current over time considering the effects of ambient parameters. The dependence of gain and energy resolution on the ratio of temperature and pressure (T/p) and accumulated charge is analysed. Necessary corrections for bias current variations are applied up to an accumulated charge per unit area of 0.48 mC/mm \(^{2}\) . An update on the results is presented in this article.