Performance Analysis of Negative Capacitance-Based Gate All Around Tunnel Field Effect Transistor
摘要
This paper analyzes a Negative Capacitance-based Gate All Around Tunnel Field Effect Transistor (NC-GAA-TFET) and its comparison with Gate All Around Tunnel Field Effect Transistor (GAA-TFET) for analog RF applications. The findings show that this proposed device features lower DIBL, improved transconductance, and a higher cut-off frequency compared to GAA-TFET. The integration of negative capacitance with GAA-TFET demonstrates improved performance in addressing Short channel effects, offering a higher \(I_{\text {ON}}/I_{\text {OFF}}\) ratio and reduced subthreshold swing compared to GAA-TFET. Additionally, the paper includes second- and third-order derivatives of transconductance, voltage intercept points—2 and 3, and a comprehensive analysis of linearity distortion in both the devices.