Relativistic Effects to Diffraction and Imaging by a Transmission Electron Microscope—Basic Theories for High-Voltage Electron Microscopy
摘要
SinceRelativistic effects electronsTransmission electron microscope (TEM) accelerated at 200 kVrunHigh-voltage electron microscopy with the velocity of 0.7 times of light velocity (c), the scattering and imaging theories should be considered under the special theory of relativity.