Characterization and Measurement of the SET Pulse Duration of the DARE65T Standard Cell Library

会议论文
发表日期：

2026年

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Laurent Berti,
Bastien Vignon,
El Hafed Boufouss,
Maxim Gorbunov,
Zheyi Li,
Marcel van de Burgwal

摘要

A novel test structure enables simultaneous measurement of SET cross-sections and pulse widths in 65 nm standard cells, validating SET filter effectiveness and supporting optimized hardening strategies for space-grade digital circuits.

A novel test structure enables simultaneous measurement of SET cross-sections and pulse widths in 65&#xa0;nm standard cells, validating SET filter effectiveness and supporting optimized hardening strategies for space-grade digital circuits.

Characterization and Measurement of the SET Pulse Duration of the DARE65T Standard Cell Library

摘要

A novel test structure enables simultaneous measurement of SET cross-sections and pulse widths in 65 nm standard cells, validating SET filter effectiveness and supporting optimized hardening strategies for space-grade digital circuits.