In this chapter, the heat transport in two-dimensional (2D) nanolayers is investigated, with a focus on achieving directional control and understanding anisotropic thermal behaviour at the nanoscale. The chapter introduces a novel characterisation technique, known as cross-sectional scanning thermal microscopy (xSThM), used to probe in-plane and cross-plane thermal conductivities in layered semiconductor materials with high spatial resolution. This method enables the direct measurement of anisotropic thermal transport, addressing limitations of conventional approaches and allowing for quantitative evaluation of thermal conductivity components in complex 2D systems. Following the experimental measurements, an analytical model is developed to describe heat flow in anisotropic media, forming the theoretical basis for interpreting the obtained data. To further validate the results and extend the analysis, finite element simulations are conducted, replicating experimental conditions and providing insight into thermal gradients and interfacial effects. The chapter also includes a systematic error evaluation using an isotropic reference structure to assess the reliability and sensitivity of the measurements. In addition to extracting directional thermal conductivities, the methodology enables estimation of the upper bounds of the interfacial thermal resistance between 2D materials and their substrates. Together, these results offer a robust platform for analysing thermal transport in layered nanostructures, with implications for future thermoelectric and heat management applications.