Intense Terahertz Pulses from Two-Color Femtosecond Laser Filamentation for Near-Field Optical Microscopy
摘要
This article provides an overview of the latest advancements in terahertz (THz) scattering-type scanning near-field optical microscopy (THz s-SNOMTHz s-SNOM) technology, with a particular emphasis on the pivotal role of different THz sources in this technique. THz s-SNOM achieves label-free imaging with nanoscale spatial resolution by detecting elastically scattered light from a metal nano-probe, thereby overcoming the diffraction limit of conventional far-field optical imaging. We present a detailed physical mechanism underlying the coupling and extracting near-field scattering signals, and the effects of tip geometry and material properties on imaging performance. Furthermore, by integrating intense THz sources with near-field optical systemsNear-field optical systems, we propose a theoretical and experiment design for near-field probes and develop a THz near-field nonlinear spectroscopy suitable for broadband intense THz sources, and explore efficient THz third harmonics generation (THG) from the Cd3As2 film in nanoscale. The intense THz s-SNOM can provide a great platform for exploring and manipulating the nonlinear physics, carriers dynamics and quantum coherent phenomena driven by the localized THz field with nanoscale resolution.