The paper presents an evaluation of the applicability of a modern multiscale method based on wavelet transformation to assess the repeatability of stylus measurements, identifying the variability of the profiles. The study was carried out using a Talysurf PGI 1200 profilometer and samples produced by L-PBF additive technology. The realization of multiple measurements of the same profile allows us to assess the impact of potential errors of the measurement process in relation to scale, which can contribute to better diagnostics. The analysis carried out showed differences in the size of irregularities during successive measurements of the sample. Both the fact that the differences occur and the place on the profile where they occur were identified. The results of the study can be applied to the evaluation of 3D surface topography using the stylus method, where multiple parallel measurements can lead to additional deformation of irregularities, as well as for diagnostic reasons in terms of the necessity of potential corrective treatments during the execution of contact measurements.