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This chapter uses the selection of single- and double-tag events described in Chap.  5 to determine the strong-phase parameters of \({{D} ^0} \rightarrow {{K} ^+} {{K} ^-} {{\pi } ^+} {{\pi } ^-} \) , using the formalism from Sect.  2.8 . The analysis can be split into two parts. First, the single- and double-tag yields are determined for each tag mode. In the second part, these yields are interpreted in terms of the strong-phase difference and other nuisance parameters.

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Measurement of Strong-Phase Differences

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  • 发表日期：

    2026年

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  • Martin Duy Tat

摘要

This chapter uses the selection of single- and double-tag events described in Chap.  5 to determine the strong-phase parameters of \({{D} ^0} \rightarrow {{K} ^+} {{K} ^-} {{\pi } ^+} {{\pi } ^-} \) , using the formalism from Sect.  2.8 . The analysis can be split into two parts. First, the single- and double-tag yields are determined for each tag mode. In the second part, these yields are interpreted in terms of the strong-phase difference and other nuisance parameters.