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Evaluating the quality of a flat layout design is an important issue. In this paper a method for layout evaluation based on frequent patterns is presented. Frequent patterns are derived from graph representation of flat layout diagrams. The obtained frequent patterns are used to augment feature vector representing the flat diagram. A number of experiments has been carried out to prove the usefulness of this approach.

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Using Frequent Subgraph Mining in Flat Layout Quality Classification

  • 会议论文

  • 发表日期：

    2026年

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  • Barbara Strug

摘要

Evaluating the quality of a flat layout design is an important issue. In this paper a method for layout evaluation based on frequent patterns is presented. Frequent patterns are derived from graph representation of flat layout diagrams. The obtained frequent patterns are used to augment feature vector representing the flat diagram. A number of experiments has been carried out to prove the usefulness of this approach.